About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
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| Symposium
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Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
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| Presentation Title |
Correlative In-situ Irradiation in TEM and TKD Analysis of Radiation Effects in Nanocrystalline Zirconia |
| Author(s) |
Junliang Liu, Wei-Ying Chen, Adrien Couet |
| On-Site Speaker (Planned) |
Junliang Liu |
| Abstract Scope |
Transmission Kikuchi Diffraction (TKD), also known as transmission-electron backscatter diffraction (t-EBSD), is an emerging technique for crystalline orientation mapping of thin transmission electron microscopy (TEM) specimens in a scanning electron microscope (SEM). Due to the small electron interaction volume, TKD is believed to provide spatial resolution down to ~3 nm. This talk reviews our application of high-resolution TKD orientation mapping, combined with in-situ dual beam (Kr and He) irradiation in the TEM, to analyze radiation effects in nanocrystalline zirconia grown on nuclear zirconium alloys. TKD mapping of the same sample area before and after in-situ TEM irradiation clearly reveals radiation-induced grain growth and phase transformation. A better understanding of radiation effects is achieved by leveraging the strengths of both techniques: in-situ TEM captures the dynamic evolution of defects, while TKD provides statistical data on radiation-induced changes such as grain size and crystal orientations. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Nuclear Materials, |