About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advances in Materials Deposition by Cold Spray and Related Technologies IV
|
| Presentation Title |
From porosity to performance: A resolution-optimized Micro-CT protocol for cold-sprayed copper |
| Author(s) |
Satish Kumar Tumulu, Tyler Dolmetsch, Tanaji Paul, Arvind Agarwal |
| On-Site Speaker (Planned) |
Satish Kumar Tumulu |
| Abstract Scope |
Across metal additive manufacturing (AM), high-resolution X-ray computed tomography (CT) is recognized as a key tool for rapid nondestructive evaluation and process qualification. Yet its application to cold spray (CS) remains limited by the absence of established standards for voxel size, scan energy, filtration, and segmentation thresholds. Copper presents a particularly demanding case as its high atomic number exacerbates beam-hardening artifacts and complicates reliable porosity quantification.
This study addresses these gaps through a systematic investigation on bulk copper CS deposits. Multiple energy and filtration combinations, beam-hardening corrections, and voxel sizes are evaluated to minimize artifacts and establish a defensible relationship between spatial resolution (voxel size) and minimum detectable pore size. Preliminary correlations between CT-derived density and mechanical, thermal conductivity measurements are also explored, linking porosity quantification to functional performance, offering a practical, reproducible framework for non-destructive CS inspection and a foundation for broader standardized micro-CT adoption in CS. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Copper / Nickel / Cobalt, Additive Manufacturing, Characterization |