| Abstract Scope |
Triple lines in polycrystals occur at the intersection of three grain boundaries and are one of the least studied defects in polycrystals. Triple lines have 11 macroscopic crystallographic degrees of freedom, so characterization of their distribution over all of these parameters would require amounts of data that appear to be unobtainable. Im this presentation, a simple two-parameter distribution that be computed from three-dimensional data is described. A comparison of the triple junction line orientation distribution (TJLOD) of several metals and ceramics, computed from three-dimensional electron backscatter diffraction data, leads to the conclusion the degree of texture (anisotropy) varies significantly. Furthermore, for the case of anisotropic distributions, the distribution is strongly influenced by the grain boundary plane anisotropy. The TJLOD of Ni is also used to test a prediction about the migration of 39°/[110] (sigma-9) grain boundaries when attached to two 60°/[111] (sigma-3) grain boundaries. |