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Meeting 2027 TMS Annual Meeting & Exhibition
Symposium Modeling, AI Applications, and Method Development in Nuclear Materials
Presentation Title Multiphysics Simulations-Guided Design of a Silicon MEMS Testbed for In-Situ Ion Irradiation Creep Testing
Author(s) Akanksha Parmar, Adam Jaafar, Olivier N. Pierron, Jacob Hirschhorn, Hi Vo, Ryan Sweet
On-Site Speaker (Planned) Akanksha Parmar
Abstract Scope Advanced multiphysics simulations enable rapid investigation of nuclear materials in extreme environments, reducing reliance on resource-intensive experiments. This work presents a coupled thermal electrical mechanical finite-element (FE) model, developed using BISON/MOOSE, of a silicon (Si) micro-electromechanical system (MEMS) testbed designed to enable high-throughput in-situ ion irradiation creep testing with electron microscopy. The model captures Joule heating, conductive/radiative heat transfer, electrical conduction, ion-beam heating, and the thermomechanical response of the device. The results are validated against thermography measurements and SEM observations. An Artificial Intelligence (AI)-driven optimization approach varies MEMS geometry to identify configurations that reduce variation in specimen temperature, buckling or fracture of actuator and load-sensor beam, while targeting to increase the size of test specimens for capturing bulk material response, thus reducing design iterations before fabrication. This coupled computational-experimental workflow, validated through fabrication and testing, demonstrates how simulation and AI can accelerate MEMS testbed development for extreme nuclear environments.
Proceedings Inclusion? Planned:

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