About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Refractory Metals 2026 – A Memorial to Todd Leonhardt
|
| Presentation Title |
Percent Recrystallization and Grain Size Measured in Niobium using the Shannon Entropy of Back-scattered Electron Data |
| Author(s) |
Trent Boritz, Shreyas Balachandran, Santosh Chetri, Philip Eisenlohr, Peter J. Lee, Eric M. Taleff |
| On-Site Speaker (Planned) |
Trent Boritz |
| Abstract Scope |
Superconducting radio frequency (SRF) cavities achieve the highest performance using Nb, but performance can be degraded by magnetic flux trapped at microstructural features such as grain boundaries, subgrain boundaries, and dislocation substructure. Quantitative characterization of these feature is important to controlling SRF cavity quality. Electron backscatter diffraction (EBSD) is extremely useful for quantitatively characterizing these features but is expensive and slow for large scan areas. Many of these features can be more easily and quickly quantified using combined back-scattered electron (CBSE) data. Shannon entropy maps of CBSE data are investigated as a tool for assessing changes to these features in Nb microstructures as a function of heat treatment. We report on 1) entropy maps from CBSE data and standard BSE images, 2) determining useful parameters for denoising and entropy calculations, and 3) measurements of percent recrystallization and grain size from both EBSD and CBSE data. |
| Proceedings Inclusion? |
Undecided |
| Keywords |
Characterization, Other, |