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Meeting 2027 TMS Annual Meeting & Exhibition
Symposium Algorithms Development in Materials Science and Engineering
Presentation Title Quantifying the Impact of EBSD Segmentation Workflows on Grain Structure Metrics
Author(s) Daniel Fried, Jake Benzing, Nik Hrabe, Austin Robert Cole Gerlt
On-Site Speaker (Planned) Daniel Fried
Abstract Scope Due to differences in applications, goals, and development history, OIM, Aztec, and MTEX use differing algorithms for both grain segmentation and cleanup of Electron Backscatter Diffraction Microscopy (EBSD) data. Our current work shows this variance is typically negligible for datasets with more than a 99% indexing success rate, but for applications with lower achievable precision, the discrepancies can become statistically significant, eventually eclipsing the predicted uncertainty related to grain count. Such variance becomes especially important when attempting to replicate literature results. Our group has quantified this algorithmic variance in morphology for samples of Inconel 718 and Ti64 relative to other common sources of uncertainty, and will present the observed trends alongside guidelines for determining when researchers should consider reprocessing raw data with consistent software to ensure high precision results.
Proceedings Inclusion? Planned:
Keywords Characterization, Modeling and Simulation, Additive Manufacturing

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