| About this Abstract |
| Meeting |
TMS Specialty Congress 2025
|
| Symposium
|
Joint Sessions of AIM, ICME, & 3DMS
|
| Presentation Title |
FIB-SEM Serial Sectioning Tomography: Towards 24-Hour Time-to-Results |
| Author(s) |
Bartlomiej Winiarski, Patrick Barthelemy, Chengge Jiao |
| On-Site Speaker (Planned) |
Bartlomiej Winiarski |
| Abstract Scope |
Focused Ion Beam – Scanning Electron Microscope (FIB-SEM) and Plasma FIB (PFIB)-SEM Serial Sectioning Tomography are well-established techniques for high-resolution, 3D imaging and analysis of materials at the multiscale. This method involves the sequential removal of thin layers of material, followed by imaging to reconstruct detailed 3D microstructures. Despite its potential, the time-intensive nature of the process has been a significant barrier to widespread adoption. Our research aims to optimize PFIB SST to achieve a 24-hour time-to-results. By integrating advanced automation techniques for focused beam sectioning and SEM imaging, along with streamlined and automated data processing and segmentation algorithms aided by AI, we propose a comprehensive approach to significantly reduce imaging, reconstruction times, data segmentation, and reporting. Exemplary results from a Solid Oxide Fuel Cell (SOFC) demonstrate promising improvements in both speed and accuracy, suggesting that a 24-hour turnaround is attainable. |
| Proceedings Inclusion? |
Definite: Post-meeting proceedings |