About this Abstract |
Meeting |
2026 TMS Annual Meeting & Exhibition
|
Symposium
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Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
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Presentation Title |
Advantages of Rotational Polarized Light Microscopy for Crystallography based Microstructure Mapping |
Author(s) |
Rodney J. McCabe, Thomas J Nizolek, Andrew W Richards |
On-Site Speaker (Planned) |
Rodney J. McCabe |
Abstract Scope |
Polarized light microscopy (PML) has been an invaluable tool for imaging microstructures of non-cubic materials for nearly 200 years. Recent advances take advantage of the inherent crystallographic information captured using rotational (R)PLM for microstructure segmentation and orientation mapping. The benefits of RPLM when compared to other modern orientation mapping techniques such as EBSD will be demonstrated for several classes of non-cubic materials. Segmentation and quantitative microstructure characterization of very large grain microstructures will be demonstrated for additively manufactured titanium alloys and cast uranium. Metal hydrides and martensitic steels will be used to demonstrate the sensitivity of RPLM to small tetraganol distortions for distinguishing tetraganol phases from similar cubic phases. Microstructure characterization of electron beam sensitive samples that are incompatible with EBSD will be demonstrated for a molecular crystal with a triclinic cubic crystal structure. |
Proceedings Inclusion? |
Planned: |
Keywords |
Characterization, Titanium, Additive Manufacturing |