About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Behavior at the Nanoscale VIII
|
| Presentation Title |
High-Temperature MEMS for In Situ Creep and Fatigue Testing Under Irradiation Extremes |
| Author(s) |
Adam Jaafar, Yichen Yang, Olivier Pierron, Michael Thompson Pettes, Rijan Karkee, Hi Tin Vo |
| On-Site Speaker (Planned) |
Adam Jaafar |
| Abstract Scope |
Advancing the performance of structural materials for Gen IV reactors requires experimental techniques capable of probing deformation under coupled extremes of irradiation, temperature, and stress. In this work, we present our current effort of developing a MEMS-based mechanical testing platform for irradiation creep and fatigue testing in situ SEM. The role of radiation damage and high temperature exposure on Si-based and SiC-based MEMS performance will be discussed. The introduction of the feedback loop design to enable real time monitoring of the creep and fatigue responses will be discussed. Device performance is validated using micro-Raman thermometry and FEM simulations, ensuring stable temperature and stress control. The high temperature small scale creep testing is demonstrated on T91 cladding materials. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Nanotechnology, Mechanical Properties, Modeling and Simulation |