About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
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Microstructure-Sensitive Modeling Across Length Scales: An MPMD/SMD Symposium in Honor of David L. McDowell
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| Presentation Title |
Rapid Microstructural-Scale Defect Assessment for AM Materials |
| Author(s) |
Jason Mayeur, Patxi Fernandez-Zelaia, Tasnim Oishi, Marko Knezevic, Michael Kirka |
| On-Site Speaker (Planned) |
Jason Mayeur |
| Abstract Scope |
Powder bed fusion additive manufacturing is an enabling technology for producing net-shaped complex component geometries from high-performance alloys. However, it is well-known that additive processes can be susceptible to various types of manufacturing and material defects that occur during processing. Additively processed materials often have unique microstructures (e.g. grain morphology and sharp texture) when compared to conventionally processed materials that should be accounted for when establishing microstructure-property relationships and assessing the impact of manufacturing defects on component performance. Manufacturing defects can often be detected and spatially mapped using various in-situ diagnostics, however this information lacks any grain scale microstructural context. In this work, we present a full-field crystal plasticity surrogate model capable of providing rapid statistical quantification of defects under microstructural uncertainty. This assessment could be used to inform a closed-loop feedback control algorithm to repair defects on-the-fly or as part of a digital component qualification framework. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Additive Manufacturing, Mechanical Properties, Modeling and Simulation |