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Meeting 2027 TMS Annual Meeting & Exhibition
Symposium Microstructure-Sensitive Design and Advanced Characterization: An MPMD/SMD Symposium Honoring David T. Fullwood
Presentation Title Sensitivity assessment of full-field HR-EBSD to pattern acquisition parameters
Author(s) Stuart I. Wright, William C. Lenthe, Matthew M. Nowell
On-Site Speaker (Planned) Stuart I. Wright
Abstract Scope Electron backscatter diffraction (EBSD) has been an essential part of Professor Fullwood’s work in microstructure sensitive design. In particular, he has been involved with cross-correlation based EBSD analysis for characterizing the strain state in polycrystalline micro structures. This branch of EBSD has evolved considerably since the first contributions of Wilkinson and co-workers. A recent step in this evolution is the full pattern matching approach. This approach has shown to be comparable to the cross-correlation approach that Fullwood and co-workers have developed and refined. In this work we present an assessment of the sensitivity of the full-field approach to practical EBSD acquisition concerns such as pattern size (i.e. number of pixels), pattern quality, projection center calibration.
Proceedings Inclusion? Planned:
Keywords Characterization,

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