About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
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Additive Manufacturing: Advanced Characterization With Synchrotron, Neutron, and In Situ Laboratory-scale Techniques IV
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| Presentation Title |
Residual Strain Measurement of AM Parts Using Synchrotron X-Ray Based Diffraction Techniques |
| Author(s) |
Andrew Chihpin Chuang, John Okasinski |
| On-Site Speaker (Planned) |
Andrew Chihpin Chuang |
| Abstract Scope |
Residual strain characterization is essential for understanding the performance and reliability of additive manufacturing (AM) components. While often referred to as "residual stress" measurement, X-ray diffraction-based methods inherently measure residual strain, which can be correlated to stress using material-specific models. This presentation explores the combined application of energy-dispersive X-ray diffraction (ED-XRD) and mono-beam diffraction techniques for non-destructive residual strain analysis. ED-XRD utilizes polychromatic synchrotron X-rays to probe discrete 3D volumes within bulk samples, enabling detailed mapping of phases and strain. Mono-beam diffraction complements this by offering high-resolution strain analysis, enhancing characterization accuracy. Together, these techniques address critical challenges in AM, such as microstructure evolution and defect mitigation, while bridging experimental data with computational models. Selected examples will demonstrate their advantages, limitations, and industrial applications, driving innovation and process qualification in AM. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Additive Manufacturing, |