| Abstract Scope |
As materials development and industrial manufacturing grow increasingly complex, the challenges to reliably study structures for accurate failure analysis also intensify. X-ray Computed Tomography (CT) is a non-destructive characterization technique that reveals internal structures of samples without strict dimension restriction or requiring extensive sample preparation. It captures inherently 3D data in a wide range of resolution, providing comprehensive and sampling bias free structure information from the material surface to the very core. Knowledge obtained through X-ray CT provides a solid foundation for both ex situ and time-resolved correlative studies in 3D space. This presentation explores the use of X-ray CT in conducting structural failure studies, including defect spatial distribution visualization, quantification, and microstructure evolution. Load simulation using X-ray CT data will also be demonstrated to show how it connects actual product performance with virtual nominal model design. Examples spanning polymers, metals, CFRP, and ceramics will be showcased. |