About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Microstructure-Sensitive Modeling Across Length Scales: An MPMD/SMD Symposium in Honor of David L. McDowell
|
| Presentation Title |
Towards Microstructure-Sensitive Modeling Validation at the Mesoscale via Synchrotron-Based Experiments |
| Author(s) |
William D. Musinski |
| On-Site Speaker (Planned) |
William D. Musinski |
| Abstract Scope |
Professor McDowell has long championed the use of microstructure-sensitive constitutive models that are grounded with and/or inspired by physical basis. Of particular emphasis has been the prescription of appropriately scaled “damage process zones” that physically represent the actual deformation and damage accumulation processes in polycrystalline metallic materials. Towards this vision, this presentation describes the integration of synchrotron x-ray diffraction measurements and crystal plasticity finite element simulations to study the evolution of scale- and time-dependent mesoscale mechanical properties during monotonic, cyclic, and fatigue crack growth loading of a Ni-base superalloy. Insights from the synchrotron experiments are being used to develop and validate an advanced crystal plasticity finite element model for simulating monotonic, cyclic, and fatigue crack growth behavior. Specific details of interest include signatures of nascent plastic deformation and interaction between microstructurally small fatigue cracks and grain boundaries. Perspectives, challenges, and outlook for scale-relevant microstructure-sensitive model validation will also be discussed. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Mechanical Properties, Modeling and Simulation, Computational Materials Science & Engineering |