About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Algorithms Development in Materials Science and Engineering
|
| Presentation Title |
Using Machine Learning to Overcome Image Clarity Derived Dendritic Characterisation Uncertainty within In-Situ, X-Ray Solidification Videos |
| Author(s) |
Jonathan Stewart Mullen, Laetitia Frost, Christos Koromilas, Wim Sillekens |
| On-Site Speaker (Planned) |
Jonathan Stewart Mullen |
| Abstract Scope |
One of the principal limiting factors in obtaining useful and timely measurements of observable dendrites within non-synchrotron, x-ray images is the issue of high image noise and low dynamic range. Given the nature of x-ray images, and the linkage between pixel intensity and dendrite position, conventional, pixel-value-altering solutions to this issue cannot be applied. While automated dendrite analysis modules have been developed, these can still struggle in instances of particularly challenging image characteristics. Thus, a new, complimentary approach is needed, one which is not solely dependent on input image clarity. By linking machine learning with dendritic arm modelling, a new solution has been developed in which higher clarity dendrites within the experimental images are used to inform the modelling of lower clarity instances. These models, oriented to match the observable experimental image as closely as possible, allow for dendritic characterisation to be successfully undertaken without a dependence on image clarity. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Machine Learning, Modeling and Simulation, Characterization |