About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
|
| Presentation Title |
Dark-Field X-ray Microscopy of Phonon & Strain Field Dynamics |
| Author(s) |
Leora E. Dresselhaus-Marais |
| On-Site Speaker (Planned) |
Leora E. Dresselhaus-Marais |
| Abstract Scope |
While mechanical properties governed by dislocations, thermal transport is strongly dependent on phonon propagation. The interactions of dislocations and phonons is essential, but much is unknown about these dynamics in bulk materials. My group developed time-resolved dark-field X-ray microscopy (DFXM) and used it to directly image defects and phonons in crystalline materials from ms-fs timescales hundreds of μm beneath the surface at X-ray free electron lasers. I will present our new insights into acoustic waves interacting with dislocations and show our more recent theory work establishing the phonon modes we observe in our real-time images. Building on this, I will demonstrate how our results have begun to explore phonon-dislocation interactions and discuss our newer work establishing multi-peak DFXM methods to quantify the 3D strain tensor fields that describe their dynamics. Our novel techniques offer key insights into the mechanisms that underlie thermal transport and phonon hardening effects across materials science. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, Other |