About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
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Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
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| Presentation Title |
Resolving Overlapping EBSD Patterns Using Iterative Dynamic Template Matching |
| Author(s) |
Grzegorz Cios, Aimo Winkelmann, Piotr Bała |
| On-Site Speaker (Planned) |
Grzegorz Cios |
| Abstract Scope |
Overlapping Kikuchi diffraction patterns often hinder accurate phase identification in Electron Backscatter Diffraction (EBSD). We present an iterative approach using dynamic template matching of dynamically simulated patterns and Gaussian-blurred pattern subtraction to resolve overlapping diffraction signals. Our method first identifies the best-fit simulated Kikuchi pattern using dynamic template matching. This pattern is then blurred to match the experimental image optimally and subsequently subtracted, revealing the underlying weaker signal. Reapplying dynamic template matching to the residual pattern ensures accurate detection of minor phases that would otherwise remain omitted. This method significantly improves phase discrimination in complex materials, addressing a key limitation of conventional EBSD analysis. This method doesn't require a known orientation relationship between two patterns or close neighbour experimental patterns like previously published approaches. During the talk several examples will be shown. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, |