About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Application of a Linear Homography Based Approach for Absolute Residual Deformation Extraction from Electron Backscatter Diffraction Patterns |
| Author(s) |
Crestienne Alexandra Dechaine, Marc De Graef |
| On-Site Speaker (Planned) |
Crestienne Alexandra Dechaine |
| Abstract Scope |
We report on a novel method for the quantification of absolute residual strain from high-resolution electron backscatter diffraction (HR-EBSD) images using a linear homography-based approach to extract the deformation gradient tensor from the Kikuchi patterns. The algorithm was applied to a partially recrystallized cold-rolled Aluminum data set. The results were then compared with the more conventional cross-correlation-based HR-EBSD approach implemented in OpenXY. The determination of absolute residual strain distributions is critical to a variety of applications, including understanding the mechanisms that govern recrystallization. The novel method aims to advance fundamental research by developing new and efficient ways to quantify residual strains. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Computational Materials Science & Engineering, |