About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Application of Mechanical Equilibrium to Correct HR-EBSD and 3D-XRD Stress Measurements |
| Author(s) |
Eralp Demir, Chris Hardie, Edmund Tarleton |
| On-Site Speaker (Planned) |
Eralp Demir |
| Abstract Scope |
Stress measurements can be performed on the scale using HR-EBSD and 3D-XRD on the grain scale. HR-EBSD is a near-surface measurement revealing stress variations inside grains as relative stress measurements that are with respect to a reference point in each grain. The 3D-XRD, however, is an absolute measurement that is obtained with respect to the undeformed lattice spacing, while it reveals stress variations at grain scale. We have developed a stress-based finite element approach to improve both measurements by applying mechanical equilibrium and traction-free constraints. The method allows computation of reference point stresses (without their constant part) from the relative stress measurements of HR-EBSD. The method also reveals the stress distributions within the grains from the grain-averaged 3D-XRD absolute stress measurements. Applications obtained by HR-EBSD and 3D-XRD measurements on a single crystal and polycrystal measurements will be illustrated. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Computational Materials Science & Engineering, |