About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Chemistry and Physics of Interfaces
|
| Presentation Title |
Quantifying Direction-Specific Interfacial Forces Between Crystalline Nanoparticles Using Oriented AFM Probes |
| Author(s) |
Xin Zhang |
| On-Site Speaker (Planned) |
Xin Zhang |
| Abstract Scope |
Understanding direction-specific interfacial forces is critical to unraveling the mechanisms that govern interface-driven phenomena such as grain boundary formation, oriented attachment, and anisotropic growth. We present a novel platform that combines focused ion beam (FIB) nanofabrication and atomic force microscopy (AFM) to directly measure interaction forces between individual nanocrystals with controlled crystallographic orientations. Using dynamic force spectroscopy and environmental TEM–AFM, we quantify azimuthally resolved forces between ZnO and TiO₂ nanocrystals in solution and under vacuum. The results reveal crystallographically specific van der Waals and hydration-mediated interactions, capable of generating torque to promote lattice alignment. Molecular dynamics simulations validate the experimental data, confirming that solvent structuring contributes significantly to the observed force anisotropy. This approach enables nanoscale probing of solid–solid and solid–liquid interfaces with sub-nanonewton precision and provides new insights into interface energetics, offering a foundation for designing advanced materials with controlled microstructures. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Thin Films and Interfaces, Characterization, Mechanical Properties |