About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Frontiers in Solidification X
|
| Presentation Title |
In Situ and Time-Resolved X-ray Imaging of Solidification Dynamics at NSLS-II |
| Author(s) |
Zhongshu Ren |
| On-Site Speaker (Planned) |
Zhongshu Ren |
| Abstract Scope |
High-resolution, non-intrusive imaging is essential for understanding microstructural evolution during solidification. This presentation highlights in situ and time-resolved capabilities at the National Synchrotron Light Source II (NSLS-II), focusing on the Full-field X-ray Imaging (FXI) beamline. FXI employs a transmission x-ray microscope to deliver 2D/3D imaging with nanometer spatial and millisecond temporal resolution, enabling real-time observation of nucleation, dendritic growth, and phase transformations. It also supports full-field X-ray Absorption Near Edge Structure (XANES) spectroscopy, providing simultaneous morphological and chemical-state insights. These advanced tools offer unique opportunities to study dynamic solidification phenomena and validate multiscale computational models, particularly in advanced manufacturing and other emerging processes, helping to address key challenges in solidification science. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Solidification, Aluminum |