About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
|
| Presentation Title |
Non-Destructive Analysis of Grain Growth Mechanisms in Ni-8Cr Alloy Using X-ray Diffraction Contrast Tomography |
| Author(s) |
Swapnil Morankar, Boopathy Kombaiah, William Chuirazzi |
| On-Site Speaker (Planned) |
Swapnil Morankar |
| Abstract Scope |
Understanding the mechanisms of grain growth in high-temperature materials is crucial for predicting their performance in extreme environments. Traditional techniques like electron backscatter diffraction and optical microscopy are destructive, preventing the study of the same grains and grain boundaries over time. In this study, we investigated grain growth mechanisms in Ni-8Cr alloy under varying temperatures and/or mechanical stresses using X-ray diffraction contrast tomography (DCT). The non-destructive nature of DCT enabled the tracking of individual grains and grain boundaries after thermo-mechanical processes. Several parameters including grain shapes and sizes, orientations, and boundary characteristics were statistically analyzed to understand grain growth mechanisms. This talk will discuss the methods of DCT data acquisition and analysis, and provide fundamental mechanistic insights into grain growth. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, High-Temperature Materials, Nuclear Materials |