About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
|
| Symposium
|
Radiation Effects in Solid-State Materials: An SMD Symposium Honoring William J Weber
|
| Presentation Title |
Angstrom-resolution Electron Microscopy on Defect Imaging with Uncorrected Probe |
| Author(s) |
Yao Li, Austin Houston, Ziang Yu, Zehui Qi, Siwei Chen, Yajie Zhao, Steven Zinkle, Gerd Duscher, Blas Uberuaga, Benjamin Derby, Sung Joo Kim |
| On-Site Speaker (Planned) |
Yao Li |
| Abstract Scope |
Irradiation-induced nanosized defect imaging with reliable statistics relies heavily on transmission electron microscopy (TEM). Nucleation of irradiation-induced defects occur at the scale < 1nm, which have been theoretically explored. Conversely, resolution limit in classical TEM-based methods stop at ~ 1-5 nm. The poor resolution in TEM has left many theories unvalidated, limiting our understanding of irradiation effects on crystals. In this presentation, we will introduce two new methods with angstrom resolution for all irradiation defects: (1) a new diffraction-based method with 5-angstrom achieved with uncorrected probe and (2) an Electron-Energy-Loss-Spectroscopy (EELS) based method to discover cavities smaller than 1 nm as well as new irradiation-induced precipitates. Our novel user-friendly techniques can help any electron microscopist extract new knowledge from the unexplored nanoscale domain and eliminate ambiguity in the classical domain via a standard instrument without extra costly attachments or steep learning curves. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Nuclear Materials, Characterization, |