About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Advanced EBSD-Based Identification of Deformation Twinning Using MTEX |
| Author(s) |
Tijmen Vermeij, Philipp Kroeker, Kamila Hamulka, Ralf Hielscher, Johann Michler, Xavier Maeder |
| On-Site Speaker (Planned) |
Tijmen Vermeij |
| Abstract Scope |
Accurate identification of deformation twinning variants, especially in hexagonal close-packed (HCP) metals, remains challenging due to the crystallographic complexity of twinning systems and their plastic deformation. We present a newly developed extension of the MTEX toolbox that enables systematic identification and classification of twin boundaries based on EBSD data. Our approach assigns each twin boundary (or pair of grains) to a specific twinning system or family by evaluating 3D misorientations. We then check whether the measured boundary trace matches the predicted habit plane and whether the identified variant is consistent with the local deformation pattern by analyzing nanoscale plastic strain fields. We demonstrate this framework on representative HCP materials, showing that it allows for robust, quantitative analysis of active twin systems during deformation. This approach facilitates detailed and automated twin characterization and offers new insights into variant selection and microstructure–property relationships in HCP alloys. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, Titanium |