About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Presentation Title |
Uncertainty in High-Angular-Precision 3D-EBSD Orientation Measurements Using Spherical Harmonic Indexing and Global Pattern Center Optimization on Deformed and Undeformed Samples |
| Author(s) |
Gregory E. Sparks, Michael D. Uchic, Paul A. Shade, Mark Obstalecki |
| On-Site Speaker (Planned) |
Gregory E. Sparks |
| Abstract Scope |
In previous work, we demonstrated the use of high-precision EBSD orientation measurements from spherical harmonic indexing (SHI) combined with global pattern center (PC) optimization in 3D-EBSD reconstruction of an undeformed Ni superalloy sample. In this talk, we discuss the layer-to-layer consistency of the orientations measured using this technique both from the previous undeformed sample and a separate, deformed Ni superalloy sample, and compare this with the consistency of repeated measurements on a single layer for both samples. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, |