About this Abstract |
Meeting |
2022 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2022)
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Symposium
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2022 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2022)
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Presentation Title |
Key Wavelength Selection for Optical Emission Spectroscopy Metrology of Direct Metal Laser Sintering |
Author(s) |
Kun-Chieh Chien, Jared Allison, Briana Cuero, Tim Phillips, Dragan Djurdjanovic, Carolyn Seepersad, Chih-Hao Chang |
On-Site Speaker (Planned) |
Kun-Chieh Chien |
Abstract Scope |
Direct Metal Laser Sintering (DMLS) is an additive manufacturing (AM) technique to create arbitrary three-dimensional parts layer-by-layer. In-situ optical emission spectroscopy (OES) has been demonstrated in recent work as a viable method to study the AM process. However, the methodology to select the key wavelengths to monitor is not well established and typically based on the peak characteristic emission. Therefore, we present a key wavelength selection method via principal component analysis (PCA) for different powers in DMLS. To validate the results, we compare the performance of linear regression models built by the identified 520 nm wavelength in previous references and key wavelengths selected via PCA. The results show that the root-mean-square error is decreased by 5.8 % and the resolving power increased by 20.4 %. In the future, this technique will be incorporated with other sensors, such as an IR camera, to achieve the in-situ AM process monitoring and control. |
Proceedings Inclusion? |
Definite: Post-meeting proceedings |