About this Abstract |
| Meeting |
2025 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2025)
|
| Symposium
|
2025 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2025)
|
| Presentation Title |
In-Situ Measurements of Selective UV Photocuring Using X-Ray Photon Correlation Spectroscopy for Vat Photopolymerization Additive Manufacturing |
| Author(s) |
Daniel Andrew Rau, Lutz Wiegart, Emmanuel Oduro , Baiqiang Huang, Liheng Cai |
| On-Site Speaker (Planned) |
Daniel Andrew Rau |
| Abstract Scope |
A fundamental challenge in Vat Photopolymerization (VP) additive manufacturing (AM) is the mismatch between the actual printing process and photocuring behavior measured with techniques such as photorheology or working curves. The stiffness of the cured material decreases with increasing depth due to the decreasing intensity of the UV irradiation as it travels through the material, but at present there are limited techniques for quantifying this behavior. We introduce a new technique that uses X-ray photon correlation spectroscopy (XPCS) to measure the spatially and temporally varying photocuring behavior by probing the nanoscale dynamics of tracer nanoparticles within the curing photoresins at various positions over time. We discover that nanoparticle velocity, vp, measured with XPCS, is related to the cured modulus, G, measured with photorheology, by the relationship Vp∝emG. This work provides new quantitative insights into curing kinetics and works towards providing a better fundamental understanding of VP AM. |
| Proceedings Inclusion? |
Planned: Post-meeting proceedings |