About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
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| Symposium
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Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) for Quantitative Materials Characterization
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| Presentation Title |
Multi-scale Characterization of Complex Alloys: 4D-STEM Across Convergence Angles |
| Author(s) |
Stephanie Ribet |
| On-Site Speaker (Planned) |
Stephanie Ribet |
| Abstract Scope |
Four-dimensional scanning transmission electron microscopy (4D-STEM) enables structural characterization beyond the capabilities of conventional techniques. 4D-STEM methods are governed by a fundamental trade-off between real-space and reciprocal-space resolution that is determined by the probe convergence angle. I will discuss complementary 4D-STEM methods spanning both small and large convergence angles and the benefits of correlative characterization. At small convergence angles, our multi-angle precession electron diffraction (MAPED) approach uses computational processing to achieve many of the benefits of precession electron diffraction without requiring dedicated hardware. I will demonstrate how MAPED improves rigorous strain and automated crystal orientation mapping measurements for complex materials. At large convergence angles, I will introduce direct and iterative electron ptychography workflows for high-resolution imaging and discuss their application to understanding the structure of medium-entropy alloys in 3D. I will emphasize practical considerations for data acquisition and analysis in applying these techniques to a broad range of materials systems. |
| Proceedings Inclusion? |
Planned: |