About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Presentation Title |
Combining Low Voltage EBSD with Spherical Indexing for Optimal Results |
| Author(s) |
Nathan Brown, Stan Watson Teago-Voufo, David P. Field |
| On-Site Speaker (Planned) |
Nathan Brown |
| Abstract Scope |
Low voltage EBSD systems enabled by direct electron detection have now been commercial for about 3 years. This system provides improved spatial resolution in heavily deformed and fine grained materials and offers the ability to obtain results on materials that would otherwise suffer from charging effects. Spherical indexing strategies allow the researcher to use lower quality EBSD patterns to obtain improved results over those that can be obtained by Hough indexing or other conventional techniques. This work discusses the use of LV EBSD on difficult to index materials including those with heavily deformed microstructures as well as SiC and other non-conductive materials. The advantage of the direct electron detector in combination with spherical indexing approaches are illuminated in this work. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, |