| Abstract Scope |
Developments in electron optics and fast detectors have revolutionized electron diffraction analysis by enabling the collection of massive diffraction datasets. Here, we first introduce this data-driven approache for fluctuation analysis of electron diffuse scattering in the study of structural disorder and defects. A coherent nanobeam is used to capture diffuse speckles over regions of interest. Cepstral transformation of speckle patterns allows the detection and mapping of interatomic vectors [1], which are powerful for mapping deformation microstructure and short-range ordering in high-entropy alloys, for example. For radiation sensitive materials, we introduce large angle rocking beam electron diffraction, which collects large diffraction datasets for structure and bonding analysis. These capabilities are in addition to strain and orientation mapping using 4D-STEM, which have become part of standard materials characterization techniques. [1] Y.-T. Shao, et. al., Ultramicroscopy 231, 113252 (2021). [2] R. Busch et al., Microscopy and Microanalysis, 31, ozae088 (2025). |