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Meeting MS&T25: Materials Science & Technology
Symposium TMS Frontiers of Materials Award Symposium: Harnessing Charged and Chemical Defects for Exceptional Structural and Functional Properties
Presentation Title Investigation of grain boundary segregation in ceramic materials using advanced electron microscopy
Author(s) Bin Feng, Naoya Shibata, Yuichi Ikuhara
On-Site Speaker (Planned) Bin Feng
Abstract Scope Grain boundary (GB) segregation is of paramount importance in both metal and ceramic materials, as the enrichment of dopant atoms at GBs significantly influences microstructure, which further determining the macroscopic properties of polycrystalline ceramics. Recent advancements in aberration-corrected scanning transmission electron microscopy (STEM) and related techniques have enabled the direct observation of GB segregation phenomena at atomic scale, enhancing our understanding of this critical process. In this study, we present our recent studies of GB segregation in ceramic materials, focusing on Al2O3 and ZrO2 GBs utilizing atomic-resolution STEM. Model GBs in doped Al₂O₃ and ZrO₂ were fabricated by the bicrystal method and subsequently analyzed by atomic-resolution STEM. Our results reveal that GB segregation in ceramics is a complex phenomenon, involving structural transformations at the GB and long-range Coulomb interactions between GB and dopants. These results will be discussed in detail during the presentation.

OTHER PAPERS PLANNED FOR THIS SYMPOSIUM

Atomistic Roughening of μm-Long Dislocation Lines under Electric Fields
Charged Dislocations, Electroplasticity and Photoplasticity in Ionic Crystals and Semiconductors
Concentration Gradients of Ionic Point Defects in Functional Oxides
Defect chemistry regulated dislocation plasticity across the length scale in SrTiO3
Dislocation induced plasticity in ceramics
Dynamics of Dislocations and Grain Boundaries in Oxides
Electric Fields Effects on Microstructural Evolution
Electroplasticity of metallic nanomaterials under extreme electrical field
Exploring Photoplastic and Electroplastic Phenomena in ZnS by Misfit Dislocation Imaging
Investigation of grain boundary segregation in ceramic materials using advanced electron microscopy
Nanoscale evaluation of light illumination effect on dislocation behavior in III-V group semiconductors by photoindentation
On the Embrittlement of Grain Boundaries in CdTe from CdCl2 Passivation
Phenomena in Metals and Alloys Controlled at the Single Defect Level
Tailoring Defects in Semiconductors: From Highly Mismatched Alloys to Polytype Heterostructures
The origin of photo plasticity in II-V compounds
Understanding recombination-enhanced dislocation processes for semiconductor optoelectronics
Understanding Self-Catalyzed Growth Kinetics of III-V Semiconductors by Modeling Solid–Melt Interfaces

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