| About this Abstract |
| Meeting |
2023 TMS Annual Meeting & Exhibition
|
| Symposium
|
Deformation Mechanisms, Microstructure Evolution, and Mechanical Properties of Nanoscale Materials
|
| Presentation Title |
Anisotropy Characterization via Correlated Mechanical Microscopy and EBSD |
| Author(s) |
Jeffrey M. Wheeler |
| On-Site Speaker (Planned) |
Jeffrey M. Wheeler |
| Abstract Scope |
Mechanical microscopy is an emerging technique using high-speed nanoindentation to map the mechanical behavior and extract phase-level properties from complex microstructures with micron-scale lateral resolution. As such, this is an ideal method to study mechanical properties variation with crystal orientation within polycrystalline materials in a high-throughput manner. These produce statistical distrbutions in mechanical properties which are a function of the elastic and plastic anisotropy of the material. In this work, we combine nanoindentation mapping and EBSD to achieve correlated datasets to provide new insights into anisotropy in mechanical properties. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, |