About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Characterization of Minerals, Metals and Materials 2026 - In-Situ Characterization Techniques
|
| Presentation Title |
Advances in X-ray Microanalysis - Bridging the Gap Between EDS and WDS |
| Author(s) |
SIMON BURGESS, Lucia Spasevski, Sonika Robertson, Michael Hjelmstad |
| On-Site Speaker (Planned) |
SIMON BURGESS |
| Abstract Scope |
Energy dispersive x-ray spectrometry (EDS) has historically been regarded as a qualitative or semi-quantitative elemental analysis technique for microanalysis in the SEM, while quantitative elemental analysis is typically carried out using complementary wavelength dispersive (WDS) analysis. The latter not only offers superior spectral resolution that easily separates peaks poorly resolved by EDS detectors but also has better detection limits for trace and minor elements. Despite the benefits of WDS systems, EDS is a more routine technique, given its relative speed, versatility, and ease of use and almost always provides the first step in characterization even when performing WDS analysis. This talk will discuss advancements in EDS technology that have significantly closed the performance gap with WDS, allowing for unprecedented accuracy under a wide range of operating conditions and for a wider range of applications. SEM-EDS now can negate the requirement for WDS for all but the most challenging of measurements. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Other, Other |