About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Utilizing Pattern Matching for High-Resolution Strain Analysis with EBSD |
| Author(s) |
Michael Hjelmstad, Mark Coleman, Kim Larsen, Aimo Winkelmann |
| On-Site Speaker (Planned) |
Michael Hjelmstad |
| Abstract Scope |
Hybrid pattern matching uses dynamical simulations to improve the orientation accuracy of EBSD by using solved orientation data via Hough-indexing as a starting point for further analysis. The orientation of the simulation can be varied to allow an order of magnitude improvement in angular precision while reaching speeds over 1000 solved patterns/sec. We utilize the same approach to directly fit strain tensors to experimentally measured patterns and can plot relative deviatoric strain on the order of 10-4m/m. For larger strains, the algorithm can also be used to analyze isochoric variations in lattice parameters on the order of 0.5%. A key advantage of this method is applying simulation-based super sampling to lower resolution patterns (e.g. 8bit, 256x256 pixels) while still achieving this metric. This enables routine strain analysis without the need to store high resolution EBSPs making data handling much easier with faster time to results. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, Other |