About this Abstract |
| Meeting |
2025 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2025)
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| Symposium
|
2025 Annual International Solid Freeform Fabrication Symposium (SFF Symp 2025)
|
| Presentation Title |
Predicting LPBF Ti-6Al-4V Microstructure via Multi-Modal In-Situ Process Monitoring |
| Author(s) |
Ankita Roy, Yasham Mundada, Bharath Bhushan Ravichander, Ryan Smith, Dana Drake, Rajiv Mishra, Yash Parikh |
| On-Site Speaker (Planned) |
Ankita Roy |
| Abstract Scope |
Accelerating qualification of LPBF components for serial production requires innovative approaches beyond extensive empirical testing. In-situ monitoring (ISM) offers a powerful means to detect and characterize process deviations in real-time, providing valuable insights into process stability. By examining identical parts and parts having systematic cross-section variations printed using Ti-6Al-4V alloy, we first aim to understand printability domain influencing in-situ sensor signals to minimize printing defects and maximize density. Next, we investigate correlation between these in-situ signatures and resulting microstructural characteristics, which are affected by thermal history, depending on part dimensions. Integration of Closed Loop Control for real-time thermal management and anomaly mitigation will also be considered, which can impact both process stability and resulting microstructure. The goal is to establish a data-driven framework that leverages ISM, potentially integrated with ML, to predict microstructural features and mechanical properties, thereby reducing reliance on time-consuming and resource-intensive post-build testing and accelerating qualifications. |
| Proceedings Inclusion? |
Planned: Post-meeting proceedings |