About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
Examining the Intragranular Elastic Strain Fields Ahead of a Small Fatigue Crack in Pure Nickel Using Point Focused X-Ray Diffraction Microscopy |
| Author(s) |
Marco Zambolin, Jose J. Solano, Andrew C. Chuang, Krzysztof S. Stopka, Sarvjit D. Shastri, Michael D. Sangid |
| On-Site Speaker (Planned) |
Marco Zambolin |
| Abstract Scope |
Engineering components spend a significant part of their lifetime in the small fatigue crack (SFC) regime, where the local microstructure affects the crack growth rate, but there is no widely accepted model to describe such behavior. The heterogeneity of the stress field ahead of the crack tip leads to variability in the propagation direction and growth rates, and the difficulty of obtaining experimental data makes it challenging to validate any model. This talk focuses on quantifying, at the sub-grain level, the elastic strain fields generated by a SFC in a pure nickel polycrystalline sample. The intragranular elastic strain and orientation fields were characterized using a far field high energy X-ray diffraction microscopy technique with a sub-micron focused beam. The reconstructed data enables an understanding of the relation between the experimentally measured intragranular elastic strain fields, and the local crack growth behavior. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Copper / Nickel / Cobalt, Characterization, Mechanical Properties |