| Abstract Scope |
Base metal electrode (BME) multilayer ceramic capacitors (MLCC) are rapidly advancing in higher volumetric capacitance, higher voltage, and higher temperature operations. BME MLCCs are being considered for aerospace, medical, and military applications, necessitating higher levels of reliability. Thus, it is essential to determine the reliability of MLCCs in terms of their lifetime. The burn-in test has been used to eliminate components with higher likelihood of infant mortality failures and to provide higher reliability components. In this process, components are exposed to high temperatures and high voltages relative to their design. This study demonstrates that the burn-in test led to intragranular and transgranular electromigration of oxygen vacancies, which will not be relaxed after the burn-in test and led to changes in reliability and lifetime of MLCCs. Dynamics of oxygen vacancies under burn-in test are studied via thermal stimulated depolarization current (TSDC), impedance spectroscopy, and in situ high accelerated lifetime testing (HALT). |