About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Chemistry and Physics of Interfaces
|
| Presentation Title |
High-Resolution Characterization of Volatile and Sensitive Interfaces in Energy Devices |
| Author(s) |
Michael Zachman, Juhyun Oh, Obeen Kwon, Daniela Ushizima, Ritu Sahore, Xi Chelsea Chen, Iryna Zenyuk |
| On-Site Speaker (Planned) |
Michael Zachman |
| Abstract Scope |
Interfaces play a key role in dictating the properties of many energy storage and conversion devices, and the nanoscale features of these interfaces often dominate their device-scale effects. While traditional electron microscopy techniques can provide structural, elemental, and bonding information down to the atomic scale, they are limited to solid materials and interfaces that are not overly sensitive to electron beams. Many next-generation energy devices utilize interfaces between beam-sensitive materials, liquids, and solids, however, which limits the ability for conventional electron microscopy techniques to reveal the native properties of these interfaces at high resolution. In this talk, we will demonstrate how advanced cryogenic focused ion beam (cryo-FIB) and cryogenic (scanning) transmission electron microscopy (cryo-(S)TEM) techniques can be utilized to access the native properties of these challenging interfaces down to the nanometer scale, providing insights that will enable next-generation devices with enhanced properties to be engineered. |
| Proceedings Inclusion? |
Planned: |