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Meeting 2027 TMS Annual Meeting & Exhibition
Symposium Microstructure-Sensitive Design and Advanced Characterization: An MPMD/SMD Symposium Honoring David T. Fullwood
Presentation Title Analysis of Excess Dislocation Content in Metals with Gradient Microstructures
Author(s) David P. Field
On-Site Speaker (Planned) David P. Field
Abstract Scope Gradient microstructures in metals can lead to improved strength with retained ductility. Solid phase processing can lead to designed gradient microstructures with gradients in grain size, crystallographic texture, dislocation content, and precipitates, among others. Each of these may have specific effects on the overall mechanical properties of the material. This presentation discusses gradient structures in copper and other metals with a specific focus on determination of the excess dislocation content (geometrically necessary dislocation density) as determined by EBSD techniques. Excess dislocations determined from conventional Hough indexing as well as dictionary and spherical indexing approaches are compared.
Proceedings Inclusion? Planned:
Keywords Copper / Nickel / Cobalt, Characterization, Mechanical Properties

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Disconnection-enabled Plastic Shear De-localization in Austenitic Stainless Steel
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Grain Boundary Effects on Nanoindentation response of Tantalum Bicrystals: Experiments and Coupled Crystal Plasticity-Cohesive Zone Element Modeling
Grain boundary segregation-controlled plasticity in magnesium rare-earth alloys
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Integrated processing–microstructure–property modeling of LPBF pure copper and GRCop-42 for rotating detonation engine applications
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Optimizing the Microstructure and Texture for a Given 6xxx Series Al Alloys Under Tensile Loading Conditions Using Crystal Plasticity
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Porosity-Dependent Fracture Prediction of Aluminum Die-Castings Using a Microstructure-Informed GTN Damage Model
Predicting Microstructure-Dependent Yield Behavior in Polycrystals Using a Stochastic Crystal Plasticity FEM Framework
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Virtual Aperture Electron Backscatter Diffraction for Dislocation Mapping
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