About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
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| Presentation Title |
On the Use of High Angular Resolution Orientation Similarity Maps for the Study of Dislocation Walls in Metallic Microstructures |
| Author(s) |
Zehua Liu, Johan Westraadt, Marc J. De Graef |
| On-Site Speaker (Planned) |
Marc J. De Graef |
| Abstract Scope |
Orientation Similarity Maps (OSMs) are a by-product of the Dictionary Indexing algorithm, which uniformly samples orientation space and determines a similarity metric (dot product, cross correlation, mutual information,...) between simulated and experimental patterns. The orientation of the simulated pattern with the highest similarity metric for a given experimental pattern is assigned as the lattice orientation at the particular sampling point. Typically, the top 20 or so best matches are also stored, and the orientation similarity is determined by considering how many of these top matches a given sampling point has in common with its four nearest neighbors. Such a map produces a clear delineation of individual grains, and clearly distinguishes between deformed and (partially) recrystallized grains. In this contribution, we present a new approach to compute a grain-by-grain high angular resolution OSM (HR-OSM) map and illustrate how it can be used to highlight dislocation walls in deformed samples. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, Computational Materials Science & Engineering |