About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Characterization Techniques for Quantifying and Modeling Deformation
|
| Presentation Title |
In-Situ Characterization and Modeling of Molecular Crystal Mechanical Response |
| Author(s) |
Daniel C. Bufford, Joseph Monti, Stewart Silling, Adam Pimentel, Dustin Ellis |
| On-Site Speaker (Planned) |
Daniel C. Bufford |
| Abstract Scope |
Discrete molecules bonded by π effects, van der Waals forces, and other weak interactions form molecular crystals without ionic, covalent, or metallic bonds. High degrees of anisotropy in elastic, plastic, and fracture behaviors are commonly encountered, and the deformation mechanisms responsible for such behaviors in these materials remain far less understood than in other materials. This talk explores the viability of focused ion beam (FIB) sample preparation and small-scale in-situ scanning electron microscope (SEM) based methods for studying deformation at the microscale in molecular crystals. Simulations based on the discrete element method (DEM) and peridynamics are introduced to aid in understanding the unique mechanical responses of these materials. Successes and challenges in sample preparation, structural characterization, mechanical loading experiments, data interpretation, and model-experiment agreement will be discussed. The approaches presented here are broadly applicable and provide new tools to better understand deformation and fracture in this class of materials. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, Modeling and Simulation |