About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Recent Advances in Electron Back-Scattered Diffraction and Related Techniques
|
| Presentation Title |
Nanoscale Quantification of Twinning Shear and Martensite Transformation Strain by In Situ TKD-DIC Tensile Testing |
| Author(s) |
Tijmen Vermeij, Philipp Kroeker, Johann Michler, Xavier Maeder |
| On-Site Speaker (Planned) |
Tijmen Vermeij |
| Abstract Scope |
Twinning and stress-induced martensitic transformation are key deformation mechanisms in advanced alloys, involving both crystallographic reorientation and plastic strain with variant-specific amplitudes and directions. To quantitatively resolve these mechanisms, simultaneous measurement of evolving crystallography and local plastic strain is essential. We extend the recently developed in situ Transmission Kikuchi Diffraction (TKD) tensile testing method at Empa Thun by integrating nanoscale Digital Image Correlation (DIC) for strain mapping. A critical feature of this approach is that the DIC speckle pattern does not interfere with the TKD signal, enabling reliable crystallographic and strain data from the same region. This combined methodology allows direct correlation between local strain fields and crystallographic transformations. In this contribution, we demonstrate its application to deformation twinning and stress-induced martensitic transformation, enabling nanoscale quantification of transformation strain and twinning shear in individual variants. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, Phase Transformations |