About this Abstract |
| Meeting |
2026 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Behavior at the Nanoscale VIII
|
| Presentation Title |
Quantification of mechanical defect relaxation with microscale resolution |
| Author(s) |
Markus Alfreider, Severin Jakob, Doris Steinmüller-Nethl, Michael Meindlhumer |
| On-Site Speaker (Planned) |
Markus Alfreider |
| Abstract Scope |
Lower dimensional defects such as vacancies, dislocations or grain boundaries are the fundamental building blocks for most of the structural and functional properties of nowadays materials. Most of the common investigation techniques for such defects are based on microscopy-based techniques and even in conjunction with external loading can only determine quasi-static snapshots of the structure at hand. However, inherently dynamic properties, such as damping or dynamic relaxation are oftentimes overlooked.
The present work showcases an extension of the micromechanical spectroscopy (µMS) technique whereby a micron sized cantilever specimen is excited with various frequencies to resolve elastic and anelastic properties on such small volumes. A wide range of materials ranging from amorphous metallic glasses over nanocrystalline diamond thin films to metallic single crystals, will be shown and detailed quantification aspects of resonance and relaxation peaks will be discussed. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Thin Films and Interfaces, Other |