| Abstract Scope |
An evolving diffraction pattern itself contains direct microstructural information. In the materials oscilloscope approach, reciprocal-space intensity is followed in real time and interpreted through spot morphology, grain statistics, azimuthal distributions, and their temporal evolution under thermal and mechanical stimulus. This enables rapid in situ tracking during thermal and thermo-mechanical processing, including recovery, recrystallization, grain growth, grain rotation, deformation mechanisms, orientation correlations, and phase-transformation pathways. Selected examples from high-energy synchrotron and neutron diffraction, with recent extension to white-beam Laue diffraction, illustrate a general framework for reading evolving microstructure directly in diffraction space under physical thermo-mechanical simulation. |