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Meeting 2026 TMS Annual Meeting & Exhibition
Symposium Fundamental Science of Microstructural Evolution and Phase Transformations: An MPMD/FMD/SMD Symposium in Honor of Peter Voorhees
Presentation Title Validating microstructure evolution models using 3D characterization
Author(s) David J. Rowenhorst
On-Site Speaker (Planned) David J. Rowenhorst
Abstract Scope Advances in computational power have significantly impacted the analysis of microstructural evolution by enabling both larger-scale 3D simulations and the acquisition of comprehensive 3D microstructural data. This has facilitated direct validation of complex models, while simulateously providing key initial conditions for further modeling efforts. Prof. Voorhees has been a leading figure in this integration, and this presentation will provide an overview of his impacts on our work and influence on this field by focusing on the development of increasingly automated experimental methods for 3D data collection and their application in validating models of particle coarsening, grain growth, and additive manufacturing.
Proceedings Inclusion? Planned:
Keywords Additive Manufacturing, Characterization, ICME

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