About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
|
| Symposium
|
Advanced Real Time Imaging for Materials Science and Processing: 10th Anniversary
|
| Presentation Title |
Atomic-Scale Insights into Extended Defects in III-Nitride Heterostructures |
| Author(s) |
Ruiying Shu, Rachel A. Oliver, Martin Frentrup, Menno J. Kappers, Huixin Xiu, Gunnar Kusch, David J. Wallis, Christina Hofer, Paul Bagot, Michael P. Moody |
| On-Site Speaker (Planned) |
Ruiying Shu |
| Abstract Scope |
Extended defects strongly influence the performance of III-nitride heterostructures; however, establishing direct links between their atomic-scale chemistry and functional properties remains a longstanding challenge. This work demonstrates how correlative atom probe tomography (APT), transmission electron microscopy (TEM), and cathodoluminescence (CL) can be combined to investigate stacking faults in cubic III-nitride heterostructures containing quantum wells. Together, these complementary techniques establish direct correlations between atomic-scale chemistry, defect structure, and optical behaviour, revealing defect-associated elemental segregation. This work highlights the potential of atom probe tomography to directly probe the atomic-scale chemistry of extended defects, advancing the understanding of their role in III-nitride heterostructures. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Electronic Materials, Other |