About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
|
| Symposium
|
Radiation Effects in Solid-State Materials: An SMD Symposium Honoring William J Weber
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| Presentation Title |
In-situ TEM study of amorphous track annealing in ion-irradiated gallium oxide |
| Author(s) |
Xingyu Liu, Farshid Reza, Maik Lang, Miaomiao Jin, Xing Wang |
| On-Site Speaker (Planned) |
Xing Wang |
| Abstract Scope |
Gallium oxide (Ga2O3) is a promising wide-bandgap semiconductor for extreme environments such as space, where materials are bombarded by energetic heavy ions. Studies have shown that swift heavy ions can create local amorphous tracks and elevated-temperature annealing may recover this damage. However, the detailed kinetics and microstructural evolution remain largely unknown. Using in-situ heating inside a transmission electron microscope (TEM), we investigated the microstructural evolution of the ion tracks. Single-crystal Ga2O3 samples were irradiated with 950 MeV Au ions. STEM imaging revealed that the resulting ion tracks exhibit a core-shell structure. Upon heating to 400 °C, both the amorphous core and shell began to shrink. After approximately 240 minutes of annealing, the amorphous tracks had largely disappeared, but the track features remained visible, although the total defected volume was significantly reduced. A detailed understanding of track annealing may offer insights into effectively healing radiation damage in Ga2O3 devices. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Electronic Materials, Modeling and Simulation |