About this Abstract |
| Meeting |
2027 TMS Annual Meeting & Exhibition
|
| Symposium
|
Four-Dimensional Scanning Transmission Electron Microscopy (4D STEM) for Quantitative Materials Characterization
|
| Presentation Title |
Interpreting Short Range Order and Defects with 4D-STEM |
| Author(s) |
Andrew M. Minor |
| On-Site Speaker (Planned) |
Andrew M. Minor |
| Abstract Scope |
This talk will describe our recent results utilizing energy filtered 4D-STEM to interpret the diffuse scattering signals that originate from short range order and defects in semiconductors as well as high and low entropy alloys. We use coordinated computational methods to simulate diffraction patterns to directly compare with experimental measurements both before and after deformation or irradiation. We will discuss recent results utilizing liquid He stages to minimize thermal diffuse scattering and building off of x-ray scattering methods to develop methods to map short range order and defects. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Modeling and Simulation, High-Entropy Alloys |