| About this Abstract |
| Meeting |
2024 TMS Annual Meeting & Exhibition
|
| Symposium
|
Mechanical Behavior at the Nanoscale VII
|
| Presentation Title |
Anisotropy Characterization via Correlated Mechanical Microscopy and EBSD |
| Author(s) |
Jeffrey M. Wheeler, Indranil Basu, Sang-Hyeok Lee, Sandra Korte-Kerzel, Jörg F. Löffler |
| On-Site Speaker (Planned) |
Jeffrey M. Wheeler |
| Abstract Scope |
Mechanical microscopy is an emerging technique using high-speed nanoindentation to map the mechanical behavior and extract phase-level properties from complex microstructures with micron-scale lateral resolution. As such, this is an ideal method to study mechanical properties variation with crystal orientation within polycrystalline materials in a high-throughput manner. These produce statistical distributions in mechanical properties which are a function of the elastic and plastic anisotropy of the material. In this work, we combine nanoindentation mapping and EBSD to achieve correlated datasets to provide new insights into anisotropy in mechanical properties. Basic relationships in the orientation dependence of indentation property distributions of various FCC, BCC, and HCP crystal structures are established for a range of pure metals. |
| Proceedings Inclusion? |
Planned: |
| Keywords |
Characterization, Mechanical Properties, Other |