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Meeting 2027 TMS Annual Meeting & Exhibition
Symposium Microstructure-Sensitive Design and Advanced Characterization: An MPMD/SMD Symposium Honoring David T. Fullwood
Presentation Title Predicting Microstructure-Dependent Yield Behavior in Polycrystals Using a Stochastic Crystal Plasticity FEM Framework
Author(s) Naji Mashrafi, Matthew Beck
On-Site Speaker (Planned) Naji Mashrafi
Abstract Scope Microstructural heterogeneity in additively manufactured materials complicates prediction of macroscopic yield behavior, particularly due to mesoscale interactions between grains. In this work, we employ a crystal plasticity finite element (CPFE) framework leveraging model representative volume elements (mRVEs) generated via the Kentucky Random Structures Toolkit (KRaSTk) to resolve heterogeneous deformation and investigate how mesoscale microstructural features govern yield stress in polycrystalline materials. Statistical ensembles of mRVEs are analyzed to characterize distributions of local stresses and strains to enable identification of the mechanisms governing the onset of plasticity. Results demonstrate strong correlations between mesoscale microstructural descriptors and effective yield stress, emphasizing the critical role of grain-scale interactions in governing macroscopic response and establishing a computational framework for microstructure-informed prediction of yield behavior in complex polycrystals.
Proceedings Inclusion? Planned:
Keywords ICME, Mechanical Properties, Modeling and Simulation

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